ia-qa.com/mcp llm and RAG testing - Dev/QA toolbox
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根据ECSS-Q-ST-60-12C第10.2.5条款,评估裸芯片批次在交付与组装之间所采用的载具、密封及存储条件:验证其配置方案,对机械防护、防潮屏障、静电防护及环境隔离性能进行评分,以其中最薄弱项作为实际提供的保护等级;以整天数记录密封失效后的车间寿命;并将每项发现与其对应的恢复措施配对。拒绝接受未知载具或密封方式、非整数天数记录以及颠倒的存储限值。适用于芯片在仓库等待期间,需判断其是否仍可投入组装的情况。触发条件:ecss、q-st-60-12c-clause-10-2-5、bare-die-carrier-protection、die-moisture-barrier-seal、die-out-of-seal-floor-life、die-store-temperature-humidity、die-electrostatic-dissipative-carrier。
| 版本 | 存档时间 | 内容哈希 | 内容 |
|---|---|---|---|
| v1 | 2026-11-13 06:25 | cb233461 | 可取 |
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IA-QA as an MCP Server
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